例句與造句

1. To get the test sheets for us
   還幫我們偷試卷
2. To get the test sheets for us
   還幫我們偷試卷
3. Accomplishing the development of square four point probe instrument with the function of image manipulation for testing sheet resistance automatically
   4完成具有圖像識別功能的全自動四探針微區(qū)電阻率測試儀的研制。
4. In this paper , the circuit used for testing sheet resistance is designed using single chip processor . additionally , we have expressed van der pauw function as a polynomial form through local and global reversal development by using the normalized polynomial match , being convenient not only for programming , but also for sheet resistance testing when using van der pauw and rymaszewski methods
   本文還利用單片機系統(tǒng)設(shè)計了薄層電阻測試電路，對于程序中用到的范德堡隱函數(shù)，利用非線性反演和規(guī)范化擬合的方法推導(dǎo)出其多項式顯函數(shù)形式。這不僅給對我們編寫程序提供了方便，也為使用范德堡法和rymaszewski法測量薄層電阻提供了便利。
5. At present , the problem in testing sheet resistance for micro - areas is that probes must be set up at the suitable locations by handwork . in order to know the wafer ' s impurity distributing , we need test many times , so will waste a lot of time . if the wafer ' s diameter would be 300mm , this problem will be more serious . in this paper , image analysis is introduced , through pre - processing and edge picking - up , the probe tips are recognized . then probe tips will be aligned respectively in two perpendicular directions through driving stepper motors . thus the distribution of sheet resistance for whole wafer is got by automatic testing and it offers information for detecting the impurity distribution and the diffusion uniformity
   這樣，完成200mm ( 8時)圓片雜質(zhì)的擴散分布需要對許多圖形進行測試，需要花費很長的時間，當測試300mm硅片時問題就更為突出。本文將圖象與視覺測量系統(tǒng)引入四探針測試系統(tǒng)中，對采集到的原始探針圖像進行預(yù)處理、邊緣提取等操作，以便實現(xiàn)探針針尖的識別，然后由電機控制實現(xiàn)探針的自動定位。這樣測試系統(tǒng)可以自動獲得全片的薄層電阻分布，為超大規(guī)模集成電路檢測雜質(zhì)分布和擴散的均勻性提供信息。
6. It's difficult to find testing sheet in a sentence. 用testing sheet造句挺難的